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Electronic Grade IPAApplication Guide

IPA for Semiconductor Wafer Cleaning

Isopropyl alcohol is the highest-volume wet process solvent in semiconductor manufacturing, consumed at every node from 28nm to sub-3nm in wafer cleaning, CMP post-clean, and Marangoni drying sequences.

Why purity matters: IPA purity directly impacts yield. Even sub-ppb metallic contamination in rinse IPA deposits on gate oxide surfaces, causing threshold voltage shifts. Particle redeposition from low-LPC IPA creates killer defects at post-CMP and post-etch steps.

Specification Requirements

Critical Parameters for Semiconductor Wafer Cleaning

Each parameter directly impacts process outcome — understand why each limit exists.

ParameterRequirementWhy This Limit Exists
Assay (GC-FID)≥99.0% (G1) to ≥99.9999% (G5)Higher assay = lower organic impurity background in rinse
Total Metals (ICP-MS)≤50 ppb (G1) to <0.1 ppb (G5)Metal ions deposit on gate oxide and cause Vt shift
Particles ≥0.5 μm (LPC)≤500/mL (G1) to ≤5/mL (G5)Particles cause post-CMP yield excursions and etch defects
Water (Karl Fischer)≤500 ppm (G1) to ≤5 ppm (G5)Excess water reduces Marangoni drying efficiency
Acetone (GC)≤500 ppm (G1) to ≤1 ppm (G5)Acetone disrupts Marangoni surface tension gradient

Grade Selection

Which Grade Do You Need?

Match your process node and contamination budget to the right grade — every grade available with full CoA.

G1
≥99.0%, metals ≤50 ppb

PCB cleaning, display glass, LED component, solar pre-clean

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G2
≥99.9%, metals ≤10 ppb

Legacy 200mm fab, ≥250nm node, compound semi substrate

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G3
≥99.99%, metals ≤2 ppb

150–250nm node, GaN/SiC substrate clean

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G4
≥99.999%, metals ≤0.5 ppb

14–65nm node, CMP post-clean, general 300mm fab

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G5
≥99.9999%, metals <0.1 ppb

Sub-7nm, EUV, Marangoni drying, EUV tool maintenance

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Electronic Grade Purity Comparison — SEMI C1 StandardG1 → G5
GradePurity (GC)Metals (ICP)ParticlesWater (KF)Process Node
G1
≥99.0%
≤50 ppb≤500/mL≤500 ppmPCB / Display / Solar
G2
≥99.9%
≤10 ppb≤100/mL≤50 ppm≥180nm Mature Node
G3
≥99.99%
≤2 ppb≤20/mL≤20 ppm45–180nm
G4
≥99.999%
≤0.5 ppb≤10/mL≤10 ppm7–45nm
G5
≥99.9999%
<0.1 ppb≤5/mL≤5 ppm<7nm / EUV / Marangoni

All grades tested by ICP-MS (28 elements), in-line LPC (ISO Class 3 fill), and Karl Fischer titration. G5 = SEMI C1 Tier D. Full CoA per lot.  Request CoA template →

Technical FAQ

Expert Answers

Q

What IPA grade is required for sub-7nm CMP post-clean?

A

G5 (SEMI C1 Tier D) is specified: ≥99.9999% purity, metals <0.1 ppb, particles ≤5 ct/mL at ≥0.5 μm, water ≤5 ppm. G4 is acceptable for 14–28nm applications.

Q

Why does Marangoni drying require G5 IPA specifically?

A

Marangoni drying relies on surface tension difference between IPA (22 mN/m) and water (72 mN/m). G5 IPA requires: water ≤5 ppm (maintains surface tension gradient), acetone ≤1 ppm (prevents Marangoni flow instability), metals <0.1 ppb (prevents surface deposition). Lower grades cause watermarks and stiction.

Q

What packaging is available for electronic grade IPA?

A

4L (qualification), 18L (R&D), 200L drum (production), 1000L IBC (high-volume), bulk tanker (gigafactory). All G4/G5 containers use N₂ blanket fill.

Related Search Topics

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Semiconductor Wafer Cleaning

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